PROCEEDINGS VOLUME 7535
IS&T/SPIE ELECTRONIC IMAGING | 17-21 JANUARY 2010
Wavelet Applications in Industrial Processing VII
Proceedings Volume 7535 is from: Logo
IS&T/SPIE ELECTRONIC IMAGING
17-21 January 2010
San Jose, California, United States
Front Matter: Volume 7535
Proc. SPIE 7535, Wavelet Applications in Industrial Processing VII, 753501 (17 February 2010); doi: 10.1117/12.858392
Image Compression
Proc. SPIE 7535, Wavelet Applications in Industrial Processing VII, 753502 (26 January 2010); doi: 10.1117/12.838874
Proc. SPIE 7535, Wavelet Applications in Industrial Processing VII, 753503 (4 February 2010); doi: 10.1117/12.840186
Signal and Image Analysis
Proc. SPIE 7535, Wavelet Applications in Industrial Processing VII, 753504 (4 February 2010); doi: 10.1117/12.838719
Proc. SPIE 7535, Wavelet Applications in Industrial Processing VII, 753505 (4 February 2010); doi: 10.1117/12.838990
Proc. SPIE 7535, Wavelet Applications in Industrial Processing VII, 753506 (4 February 2010); doi: 10.1117/12.839185
Proc. SPIE 7535, Wavelet Applications in Industrial Processing VII, 753507 (4 February 2010); doi: 10.1117/12.842734
Proc. SPIE 7535, Wavelet Applications in Industrial Processing VII, 753508 (4 February 2010); doi: 10.1117/12.843039
Blur and Noise Estimation and Restoration
Proc. SPIE 7535, Wavelet Applications in Industrial Processing VII, 753509 (4 February 2010); doi: 10.1117/12.841714
Proc. SPIE 7535, Wavelet Applications in Industrial Processing VII, 75350A (4 February 2010); doi: 10.1117/12.839524
Proc. SPIE 7535, Wavelet Applications in Industrial Processing VII, 75350B (4 February 2010); doi: 10.1117/12.840667
Proc. SPIE 7535, Wavelet Applications in Industrial Processing VII, 75350C (4 February 2010); doi: 10.1117/12.839501
Watermarking, Image Retrieval, and 3D Meshes Analysis
Proc. SPIE 7535, Wavelet Applications in Industrial Processing VII, 75350E (4 February 2010); doi: 10.1117/12.839867
Proc. SPIE 7535, Wavelet Applications in Industrial Processing VII, 75350G (4 February 2010); doi: 10.1117/12.843838
Proc. SPIE 7535, Wavelet Applications in Industrial Processing VII, 75350H (4 February 2010); doi: 10.1117/12.845595
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