Translator Disclaimer
18 January 2010 Evaluation of color error and noise on simulated images
Author Affiliations +
The evaluation of CMOS sensors performance in terms of color accuracy and noise is a big challenge for camera phone manufacturers. On this paper, we present a tool developed with Matlab at STMicroelectronics which allows quality parameters to be evaluated on simulated images. These images are computed based on measured or predicted Quantum Efficiency (QE) curves and noise model. By setting the parameters of integration time and illumination, the tool optimizes the color correction matrix (CCM) and calculates the color error, color saturation and signal-to-noise ratio (SNR). After this color correction optimization step, a Graphics User Interface (GUI) has been designed to display a simulated image at a chosen illumination level, with all the characteristics of a real image taken by the sensor with the previous color correction. Simulated images can be a synthetic Macbeth ColorChecker, for which reflectance of each patch is known, or a multi-spectral image, described by the reflectance spectrum of each pixel or an image taken at high-light level. A validation of the results has been performed with ST under development sensors. Finally we present two applications one based on the trade-offs between color saturation and noise by optimizing the CCM and the other based on demosaicking SNR trade-offs.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Clémence Mornet, Jérôme Vaillant, Thomas Decroux, Didier Hérault, and Isabelle Schanen "Evaluation of color error and noise on simulated images", Proc. SPIE 7537, Digital Photography VI, 75370Y (18 January 2010);


Quality versus color saturation and noise
Proceedings of SPIE (January 24 2012)
Evaluation of LED flash performance for camera phones
Proceedings of SPIE (January 24 2011)
From spectral sensitivities to noise characteristics
Proceedings of SPIE (February 19 2007)
Color-blotch noise characterization for CMOS cameras
Proceedings of SPIE (January 18 2009)

Back to Top