PROCEEDINGS VOLUME 7544
SIXTH INTERNATIONAL SYMPOSIUM ON PRECISION ENGINEERING MEASUREMENTS AND INSTRUMENTATION | 8-10 AUGUST 2010
Sixth International Symposium on Precision Engineering Measurements and Instrumentation
Editor(s): Jiubin Tan, Xianfang Wen
SIXTH INTERNATIONAL SYMPOSIUM ON PRECISION ENGINEERING MEASUREMENTS AND INSTRUMENTATION
8-10 August 2010
Hangzhou, China
Front Matter: Volume 7544
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754401 (24 February 2011); doi: 10.1117/12.888137
Instrumentation Theory and Methodology
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754402 (28 December 2010); doi: 10.1117/12.885879
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754403 (28 December 2010); doi: 10.1117/12.885389
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Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754405 (28 December 2010); doi: 10.1117/12.885285
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754406 (28 December 2010); doi: 10.1117/12.887304
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754407 (28 December 2010); doi: 10.1117/12.885814
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754408 (28 December 2010); doi: 10.1117/12.885393
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754409 (28 December 2010); doi: 10.1117/12.885453
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75440A (28 December 2010); doi: 10.1117/12.885810
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75440B (28 December 2010); doi: 10.1117/12.885336
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75440C (28 December 2010); doi: 10.1117/12.885816
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75440D (28 December 2010); doi: 10.1117/12.885815
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75440E (28 December 2010); doi: 10.1117/12.885837
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75440F (28 December 2010); doi: 10.1117/12.885681
Measurement for Precision and Ultra-Precision Machining
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75440G (28 December 2010); doi: 10.1117/12.886181
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75440H (28 December 2010); doi: 10.1117/12.885187
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75440I (28 December 2010); doi: 10.1117/12.885413
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75440J (28 December 2010); doi: 10.1117/12.885660
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75440K (28 December 2010); doi: 10.1117/12.885825
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75440L (28 December 2010); doi: 10.1117/12.885401
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75440M (28 December 2010); doi: 10.1117/12.885892
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75440N (28 December 2010); doi: 10.1117/12.886238
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75440O (28 December 2010); doi: 10.1117/12.885821
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75440P (28 December 2010); doi: 10.1117/12.885661
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75440Q (28 December 2010); doi: 10.1117/12.885888
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75440R (28 December 2010); doi: 10.1117/12.885576
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75440S (28 December 2010); doi: 10.1117/12.885843
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75440T (28 December 2010); doi: 10.1117/12.885669
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75440U (28 December 2010); doi: 10.1117/12.885556
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75440V (28 December 2010); doi: 10.1117/12.885929
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75440W (28 December 2010); doi: 10.1117/12.885472
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75440X (28 December 2010); doi: 10.1117/12.885400
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75440Y (28 December 2010); doi: 10.1117/12.885461
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75440Z (28 December 2010); doi: 10.1117/12.885227
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754410 (28 December 2010); doi: 10.1117/12.885972
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754411 (28 December 2010); doi: 10.1117/12.885215
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754412 (28 December 2010); doi: 10.1117/12.885664
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754413 (28 December 2010); doi: 10.1117/12.885288
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754414 (28 December 2010); doi: 10.1117/12.885613
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Novel Instrument and Measurement System
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754417 (28 December 2010); doi: 10.1117/12.885909
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754418 (28 December 2010); doi: 10.1117/12.885190
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754419 (28 December 2010); doi: 10.1117/12.885194
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75441A (28 December 2010); doi: 10.1117/12.885701
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75441B (28 December 2010); doi: 10.1117/12.885699
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75441C (28 December 2010); doi: 10.1117/12.885464
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75441D (28 December 2010); doi: 10.1117/12.886007
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75441E (28 December 2010); doi: 10.1117/12.886294
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75441F (28 December 2010); doi: 10.1117/12.885414
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75441G (28 December 2010); doi: 10.1117/12.885551
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75441H (28 December 2010); doi: 10.1117/12.885306
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75441I (28 December 2010); doi: 10.1117/12.885293
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75441J (28 December 2010); doi: 10.1117/12.886016
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75441K (28 December 2010); doi: 10.1117/12.885274
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75441L (28 December 2010); doi: 10.1117/12.885663
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75441M (28 December 2010); doi: 10.1117/12.885317
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75441N (28 December 2010); doi: 10.1117/12.885421
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75441O (28 December 2010); doi: 10.1117/12.885452
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75441P (28 December 2010); doi: 10.1117/12.885318
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75441Q (28 December 2010); doi: 10.1117/12.886168
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75441R (28 December 2010); doi: 10.1117/12.885275
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75441S (28 December 2010); doi: 10.1117/12.885193
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75441T (28 December 2010); doi: 10.1117/12.885230
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75441U (28 December 2010); doi: 10.1117/12.885321
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75441V (28 December 2010); doi: 10.1117/12.885203
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75441W (28 December 2010); doi: 10.1117/12.885656
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75441X (28 December 2010); doi: 10.1117/12.885845
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75441Y (28 December 2010); doi: 10.1117/12.885608
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75441Z (28 December 2010); doi: 10.1117/12.885239
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754420 (28 December 2010); doi: 10.1117/12.886346
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754421 (28 December 2010); doi: 10.1117/12.885415
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754422 (28 December 2010); doi: 10.1117/12.885322
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754423 (28 December 2010); doi: 10.1117/12.885280
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754424 (28 December 2010); doi: 10.1117/12.885873
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754425 (28 December 2010); doi: 10.1117/12.885295
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754426 (28 December 2010); doi: 10.1117/12.885218
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754427 (28 December 2010); doi: 10.1117/12.885817
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754428 (28 December 2010); doi: 10.1117/12.885429
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754429 (28 December 2010); doi: 10.1117/12.885479
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75442A (28 December 2010); doi: 10.1117/12.885426
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75442B (28 December 2010); doi: 10.1117/12.885686
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75442C (28 December 2010); doi: 10.1117/12.885609
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75442D (28 December 2010); doi: 10.1117/12.885838
Modern Optics and Instruments for Precision Measurement
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75442E (28 December 2010); doi: 10.1117/12.885565
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75442F (28 December 2010); doi: 10.1117/12.885455
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75442G (29 December 2010); doi: 10.1117/12.885868
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75442H (29 December 2010); doi: 10.1117/12.885971
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75442I (29 December 2010); doi: 10.1117/12.885365
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75442J (29 December 2010); doi: 10.1117/12.885508
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75442K (29 December 2010); doi: 10.1117/12.885599
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75442L (29 December 2010); doi: 10.1117/12.885803
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75442M (29 December 2010); doi: 10.1117/12.885284
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75442N (29 December 2010); doi: 10.1117/12.885436
Sensors, Converters, and Control System
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75442O (29 December 2010); doi: 10.1117/12.885191
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75442P (29 December 2010); doi: 10.1117/12.885688
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75442Q (29 December 2010); doi: 10.1117/12.885433
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75442R (29 December 2010); doi: 10.1117/12.886106
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75442S (29 December 2010); doi: 10.1117/12.885893
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75442T (29 December 2010); doi: 10.1117/12.885374
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75442U (29 December 2010); doi: 10.1117/12.885567
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75442V (31 December 2010); doi: 10.1117/12.885559
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75442W (31 December 2010); doi: 10.1117/12.885405
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75442X (31 December 2010); doi: 10.1117/12.885842
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75442Y (31 December 2010); doi: 10.1117/12.885562
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75442Z (31 December 2010); doi: 10.1117/12.885363
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754430 (31 December 2010); doi: 10.1117/12.885822
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Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754432 (31 December 2010); doi: 10.1117/12.885201
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Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754437 (31 December 2010); doi: 10.1117/12.885411
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754438 (31 December 2010); doi: 10.1117/12.885348
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754439 (31 December 2010); doi: 10.1117/12.885430
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75443A (31 December 2010); doi: 10.1117/12.885811
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75443B (31 December 2010); doi: 10.1117/12.885819
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75443C (31 December 2010); doi: 10.1117/12.885233
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75443D (31 December 2010); doi: 10.1117/12.886214
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75443E (31 December 2010); doi: 10.1117/12.885399
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75443F (31 December 2010); doi: 10.1117/12.885245
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75443G (31 December 2010); doi: 10.1117/12.886053
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75443H (31 December 2010); doi: 10.1117/12.885670
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75443I (31 December 2010); doi: 10.1117/12.885454
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75443J (31 December 2010); doi: 10.1117/12.885451
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75443K (31 December 2010); doi: 10.1117/12.886018
Optoelectronic System and Optical Instruments Design
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75443L (31 December 2010); doi: 10.1117/12.887434
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75443M (31 December 2010); doi: 10.1117/12.885827
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75443N (31 December 2010); doi: 10.1117/12.885594
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75443O (31 December 2010); doi: 10.1117/12.885692