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28 December 2010 Mechanism of STED microscopy and analysis of the factors affecting resolution
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Proceedings Volume 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation; 75440F (2010) https://doi.org/10.1117/12.885681
Event: Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 2010, Hangzhou, China
Abstract
Stimulated emission depletion (STED) microscopy exploits nonlinear saturable optical transition of fluorescent molecules, allowed to overcome Abbe's diffraction-limit and provides diffraction-unlimited resolution in far-field optical microscopy. We elaborate the mechanism of STED and the conditions of depletion. The formula of STED microcopy resolution is deduced through effective point spread function (E-PSF). The STED system resolution is mainly dominated by the quality of the fluorescence depletion patterns in the focal plane. The depletion pattern is mainly affected by STED beam intensity, polarization, phase plate, primary aberrations, STED pulse shape, pulse duration and delay time. In this paper, we found related models and simulate the relationship between the depletion patterns and the parameters, and put forward effective approach to enhance the system resolution.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yang Peng and Ai Hua "Mechanism of STED microscopy and analysis of the factors affecting resolution", Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75440F (28 December 2010); https://doi.org/10.1117/12.885681
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