Three-dimensional profile measurement based on light-section method

Shicheng Wang; Quanke Zhao; Zeyong Wang; Xiaohong Zhou

doi:10.1117/12.885929

28 December 2010 Three-dimensional profile measurement based on light-section method

Shicheng Wang, Quanke Zhao, Zeyong Wang, Xiaohong Zhou

Proceedings Volume 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation; 75440V (2010) https://doi.org/10.1117/12.885929
Event: Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 2010, Hangzhou, China

Abstract

This paper describes a computer vision method for reconstruction of three-dimensional object which is capable of reconstructing the profile of the object real time and achieving high accuracy. The approach makes use of the light-section projecting a line-laser beam on the surface of an object. This work is distinguished by three key contributions. The first is the introduction of the light-section method and laser triangulation method. The space coordinates of points in the bright stripe which are considered as the first bright stripe outlining the measured object can be figured out by way of the laser triangulation method. The second contribution is algorithms of coordinate restoration, involved camera calibration and calibration of the central axis of turntable, which restores the space coordinates of the original points in the original bright stripe from that of being considered as the first bright stripe. The third is the profile reconstruction method for plotting the profile of the measured object using the OpenGL. In this paper, an experiment on a small disposal paper cup has been carried out and the three-dimensional profile of the paper cup has been obtained. The results meet the requirement of high accuracy and simplicity of computation.

Citation Download Citation

Shicheng Wang, Quanke Zhao, Zeyong Wang, and Xiaohong Zhou "Three-dimensional profile measurement based on light-section method", Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75440V (28 December 2010); https://doi.org/10.1117/12.885929

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