The retardation measurement of multiple-order wave plates using white-light Michelson interferometer

Jun Wang; Lei Chen; Bo Li; Lili Shi; Ting Luo

doi:10.1117/12.885193

28 December 2010 The retardation measurement of multiple-order wave plates using white-light Michelson interferometer

Jun Wang, Lei Chen, Bo Li, Lili Shi, Ting Luo

Proceedings Volume 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation; 75441S (2010) https://doi.org/10.1117/12.885193
Event: Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 2010, Hangzhou, China

Abstract

A method based on white-light Michelson interferometer for measuring the retardation of multiple-order wave plates is presented. The linear polarized white-light splits into o-beam and e-beam by the test multiple-order wave plate which introduces retardation between the two beams, and then they are divided by a beam splitter and reflected by two plane mirrors in the Michelson interferometer respectively. Finally three white-light interference packets are formed. According to the optical path between the center packet and one of the side packets, the retardation can be obtained. The retardation of a multiple-order wave plate is measured in the experiment, whose result (2990.6nm) coincides with the one obtained by spectroscopic method (2992.8nm).

Citation Download Citation

Jun Wang, Lei Chen, Bo Li, Lili Shi, and Ting Luo "The retardation measurement of multiple-order wave plates using white-light Michelson interferometer", Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75441S (28 December 2010); https://doi.org/10.1117/12.885193

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