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28 December 2010 Analysis of electrical tomography sensitive field based on multi-terminal network and electric field
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Proceedings Volume 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation; 75441Y (2010) https://doi.org/10.1117/12.885608
Event: Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 2010, Hangzhou, China
Abstract
Electrical tomography (ET) aims at the study of the conductivity/permittivity distribution of the interested field non-intrusively via the boundary voltage/current. The sensor is usually regarded as an electric field, and finite element method (FEM) is commonly used to calculate the sensitivity matrix and to optimize the sensor architecture. However, only the lumped circuit parameters can be measured by the data acquisition electronics, it's very meaningful to treat the sensor as a multi terminal network. Two types of multi terminal network with common node and common loop topologies are introduced. Getting more independent measurements and making more uniform current distribution are the two main ways to minimize the inherent ill-posed effect. By exploring the relationships of network matrixes, a general formula is proposed for the first time to calculate the number of the independent measurements. Additionally, the sensitivity distribution is analyzed with FEM. As a result, quasi opposite mode, an optimal single source excitation mode, that has the advantages of more uniform sensitivity distribution and more independent measurements, is proposed.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yongbo He, Xingguo Su, Meng Xu, and Huaxiang Wang "Analysis of electrical tomography sensitive field based on multi-terminal network and electric field", Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75441Y (28 December 2010); https://doi.org/10.1117/12.885608
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