Paper
28 December 2010 3D measurement system based on computer-generated gratings
Yongjian Zhu, Weiqing Pan, Yanliang Luo
Author Affiliations +
Proceedings Volume 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation; 754423 (2010) https://doi.org/10.1117/12.885280
Event: Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 2010, Hangzhou, China
Abstract
A new kind of 3D measurement system has been developed to achieve the 3D profile of complex object. The principle of measurement system is based on the triangular measurement of digital fringe projection, and the fringes are fully generated from computer. Thus the computer-generated four fringes form the data source of phase-shifting 3D profilometry. The hardware of system includes the computer, video camera, projector, image grabber, and VGA board with two ports (one port links to the screen, another to the projector). The software of system consists of grating projection module, image grabbing module, phase reconstructing module and 3D display module. A software-based synchronizing method between grating projection and image capture is proposed. As for the nonlinear error of captured fringes, a compensating method is introduced based on the pixel-to-pixel gray correction. At the same time, a least square phase unwrapping is used to solve the problem of phase reconstruction by using the combination of Log Modulation Amplitude and Phase Derivative Variance (LMAPDV) as weight. The system adopts an algorithm from Matlab Tool Box for camera calibration. The 3D measurement system has an accuracy of 0.05mm. The execution time of system is 3~5s for one-time measurement.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yongjian Zhu, Weiqing Pan, and Yanliang Luo "3D measurement system based on computer-generated gratings", Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754423 (28 December 2010); https://doi.org/10.1117/12.885280
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KEYWORDS
3D metrology

Computing systems

Cameras

Phase shift keying

Projection systems

Imaging systems

Calibration

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