28 December 2010 Solving SOC test scheduling problem using cross-entropy method
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Proceedings Volume 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation; 754427 (2010) https://doi.org/10.1117/12.885817
Event: Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 2010, Hangzhou, China
Abstract
With the increase of the number of IP cores integrated in SOC, the functions of SOC are becoming more complexed. Test time and test cost grow rapidly, therefore it becomes bottleneck of SOC test. Test scheduling is one of the efficient approaches to solve the forenamed question. Cross-entropy method, which is based on probability density function, has been used to solve the SOC test scheduling problem. Experimental results on ITC'02 benchmarks show that the proposed method provides better test time results compared to the Linear-Programming.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Libao Deng, Libao Deng, Liyan Qiao, Liyan Qiao, Xiyuan Peng, Xiyuan Peng, } "Solving SOC test scheduling problem using cross-entropy method", Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754427 (28 December 2010); doi: 10.1117/12.885817; https://doi.org/10.1117/12.885817
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