Paper
28 December 2010 Design and simulation of whole closed-loop algorithm for motion platform control for automated optical inspection
Zhou Fang, Danchao Chen, Xiaona Wang, Suijun Yang
Author Affiliations +
Proceedings Volume 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation; 75446W (2010) https://doi.org/10.1117/12.885432
Event: Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 2010, Hangzhou, China
Abstract
2D motion platform plays an essential role in an automatic optical inspection (AOI) system, whose speed and positioning accuracy directly determine the inspection accuracy, efficiency and stability of the system. Conventional PID control is not able to meet the demands of high precision, high performance requirements and so on. This paper proposes whole closed-loop algorithm, which is a new control algorithm to achieve quick dynamic response and small tracking error simultaneously. According to an actual 2D motion platform model in Matlab/Simulink simulation, a series of experiments have been conducted, and the results show that the whole closed-loop PID controller is better than the conventional PID control with satisfactory accuracy and robustness, and enhances dynamic and static performance. The simulation results were compared with the theoretical research to verify the validity of the algorithm described in this paper. The new algorithm is useful in targeting the best control for motion platforms.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhou Fang, Danchao Chen, Xiaona Wang, and Suijun Yang "Design and simulation of whole closed-loop algorithm for motion platform control for automated optical inspection", Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75446W (28 December 2010); https://doi.org/10.1117/12.885432
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KEYWORDS
Control systems

Motion controllers

Optical inspection

Computer simulations

Detection and tracking algorithms

Inspection

Device simulation

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