25 February 2010 Self-reference extended depth-of-field quantitative phase microscopy
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Abstract
This paper describes a novel quantitative phase microscopy based on a simple self-referencing scheme using Michelson interferometry. In order to achieve the homogeneous reference field for accurate phase measurement, the imaging field-of-view (FOV) is split onto the sample and homogenous background areas. The reference field can be generated by rotating the relative position of the sample and homogenous background in the object arm. Furthermore, our system is realized using an extended depth-of-field (eDOF) optics, which allows quantitative phase measurement for an increase of the depth-of-field without moving objective lens or specimen. The proposed method is confirmed by experimental results using various samples such as polystyrene beads and red blood cells (RBCs).
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Jaeduck Jang, Jaeduck Jang, Chae Yun Bae, Chae Yun Bae, Je-Kyun Park, Je-Kyun Park, Jong Chul Ye, Jong Chul Ye, } "Self-reference extended depth-of-field quantitative phase microscopy", Proc. SPIE 7570, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVII, 757018 (25 February 2010); doi: 10.1117/12.843082; https://doi.org/10.1117/12.843082
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