17 February 2010 Improved bond strength characterization of chemically activated direct bonding (CADB) epoxy-free bonded solid state laser materials
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Proceedings Volume 7578, Solid State Lasers XIX: Technology and Devices; 75780F (2010); doi: 10.1117/12.846285
Event: SPIE LASE, 2010, San Francisco, California, United States
Abstract
Chemically Activated Direct Bonding (CADB®) has become widely utilized as an epoxy-free assembly process for solid state laser crystals in high fluence and other aggressive environments. While data has been presented as to both optical and mechanical properties of these bond interfaces, previous research has hinted that sample preparation plays a large part in the final results. Surface finish of samples and any surface defects or sub-surface damage present can lead to artificially low strength values and other inconclusive results. In the current study, we prepared samples with polished surfaces to improve the accuracy of the bond strength measurements. Here we present strength data for bonded and bulk samples of common laser materials such as YAG, phosphate glass, and fused silica.
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Nick G. Traggis, Neil R. Claussen, "Improved bond strength characterization of chemically activated direct bonding (CADB) epoxy-free bonded solid state laser materials", Proc. SPIE 7578, Solid State Lasers XIX: Technology and Devices, 75780F (17 February 2010); doi: 10.1117/12.846285; https://doi.org/10.1117/12.846285
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KEYWORDS
Surface finishing

YAG lasers

Polishing

Glasses

Ceramics

Silica

Interfaces

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