17 February 2010 New developments in STED microscopy
Author Affiliations +
Proceedings Volume 7578, Solid State Lasers XIX: Technology and Devices; 75781X (2010); doi: 10.1117/12.843156
Event: SPIE LASE, 2010, San Francisco, California, United States
Abstract
STED microscopy has gained recognition as a method to break the diffraction limit of conventional light microscopy. Despite being a new technique, STED is already successfully implemented in life science research. The resolution enhancement is achieved by depleting fluorescent markers via stimulated emission. The performance is significantly dependent on the laser source and the fluorescence markers. Therefore the use of novel fluorescent markers in conjunction with the right laser system was the main focus of our research. We present new developments and applications of STED microscopy, unraveling structural details on scales below 90nm and give an overview of required specifications for the solid state laser systems.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Arnold Giske, Jochen Sieber, Hilmar Gugel, Marcus Dyba, Volker Seyfried, Dietmar Gnass, "New developments in STED microscopy", Proc. SPIE 7578, Solid State Lasers XIX: Technology and Devices, 75781X (17 February 2010); doi: 10.1117/12.843156; https://doi.org/10.1117/12.843156
PROCEEDINGS
6 PAGES


SHARE
Back to Top