Multiwavelength optical fiber refractive index profiling

Andrew D. Yablon

doi:10.1117/12.841883

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17 February 2010 Multiwavelength optical fiber refractive index profiling

Andrew D. Yablon

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Proceedings Volume 7580, Fiber Lasers VII: Technology, Systems, and Applications; 758015 (2010) https://doi.org/10.1117/12.841883
Event: SPIE LASE, 2010, San Francisco, California, United States

Abstract

Fourier transform spectroscopy and interference microscopy are combined to provide the world's first multi-wavelength optical fiber refractive index profile (RIP) measurements. The RIP and its spectral dependence are obtained with submicron spatial resolution across an octave stretching from about 500 nm to the 1 micron operating band of Yb-doped fiber lasers and amplifiers. In contrast to commercial Refracted Near Field (RNF) technology, which measures at a cleave, the technique described here measures transversely through the side of an uncleaved fiber, enabling measurements of axial fiber RIP variations found in fiber gratings, physical tapers, and fusion splices.

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Andrew D. Yablon "Multiwavelength optical fiber refractive index profiling", Proc. SPIE 7580, Fiber Lasers VII: Technology, Systems, and Applications, 758015 (17 February 2010); https://doi.org/10.1117/12.841883