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17 February 2010Multiwavelength optical fiber refractive index profiling
Fourier transform spectroscopy and interference microscopy are combined to provide the world's first multi-wavelength
optical fiber refractive index profile (RIP) measurements. The RIP and its spectral dependence are obtained with submicron
spatial resolution across an octave stretching from about 500 nm to the 1 micron operating band of Yb-doped
fiber lasers and amplifiers. In contrast to commercial Refracted Near Field (RNF) technology, which measures at a
cleave, the technique described here measures transversely through the side of an uncleaved fiber, enabling
measurements of axial fiber RIP variations found in fiber gratings, physical tapers, and fusion splices.
Andrew D. Yablon
"Multiwavelength optical fiber refractive index profiling", Proc. SPIE 7580, Fiber Lasers VII: Technology, Systems, and Applications, 758015 (17 February 2010); https://doi.org/10.1117/12.841883
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Andrew D. Yablon, "Multiwavelength optical fiber refractive index profiling," Proc. SPIE 7580, Fiber Lasers VII: Technology, Systems, and Applications, 758015 (17 February 2010); https://doi.org/10.1117/12.841883