17 February 2010 Reliability of high-power QCW arrays
Author Affiliations +
Northrop Grumman Cutting Edge Optronics has developed a family of arrays for high-power QCW operation. These arrays are built using CTE-matched heat sinks and hard solder in order to maximize the reliability of the devices. A summary of a recent life test is presented in order to quantify the reliability of QCW arrays and associated laser gain modules. A statistical analysis of the raw lifetime data is presented in order to quantify the data in such a way that is useful for laser system designers. The life tests demonstrate the high level of reliability of these arrays in a number of operating regimes. For single-bar arrays, a MTTF of 19.8 billion shots is predicted. For four-bar samples, a MTTF of 14.6 billion shots is predicted. In addition, data representing a large pump source is analyzed and shown to have an expected lifetime of 13.5 billion shots. This corresponds to an expected operational lifetime of greater than ten thousand hours at repetition rates less than 370 Hz.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ryan Feeler, Ryan Feeler, Jeremy Junghans, Jeremy Junghans, Jennifer Remley, Jennifer Remley, Don Schnurbusch, Don Schnurbusch, Ed Stephens, Ed Stephens, } "Reliability of high-power QCW arrays", Proc. SPIE 7583, High-Power Diode Laser Technology and Applications VIII, 758304 (17 February 2010); doi: 10.1117/12.840730; https://doi.org/10.1117/12.840730


High power diode lasers emitting from 639 nm to 690...
Proceedings of SPIE (March 06 2014)
Beam shaping concepts for kW class CW and QCW diode...
Proceedings of SPIE (April 21 2016)
New 808 nm high power laser diode pump module for...
Proceedings of SPIE (November 20 2017)
QCW diode array reliability at 80x and 88x nm
Proceedings of SPIE (February 21 2011)
Laser Diode Array For A Laser Printer
Proceedings of SPIE (July 15 1986)
Highly reliable high power cw AlGaAs (808 nm) 1 cm...
Proceedings of SPIE (April 09 1995)

Back to Top