18 February 2010 Reliable operation of 8xx mini-bar-based hermetic modules
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Proceedings Volume 7583, High-Power Diode Laser Technology and Applications VIII; 758306 (2010); doi: 10.1117/12.842838
Event: SPIE LASE, 2010, San Francisco, California, United States
Abstract
In this work we show that mini-bar-based 8xx products show the reliability characteristics of independent emitter failures and "non-degrading" drift plots similar to those of their 9xx counterparts. This fact is in part an outcome of the bonding process and heat-sink design. Multi-cell life testing gives projected reliable operation of compact, fiber-coupled modules (200-μm-diameter, 0.15 NA) at 30 W and 808 nm, with 35 W at 880 nm.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xu Jin, Serge Cutillas, Daming Liu, Ed Wolak, Sang-Ki Park, Kelly Johnson, Terry Towe, Dino Lenarduzzi, Touyen Nguyen, Tom Truchan, Jeff Mott, James Harrison, Andrea Guarino, Jürgen Müller, Susanne Pawlik, Boris Sverdlov, Norbert Lichtenstein, Chris Button, "Reliable operation of 8xx mini-bar-based hermetic modules", Proc. SPIE 7583, High-Power Diode Laser Technology and Applications VIII, 758306 (18 February 2010); doi: 10.1117/12.842838; https://doi.org/10.1117/12.842838
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KEYWORDS
Reliability

Semiconductor lasers

Diodes

Semiconducting wafers

Continuous wave operation

Fiber couplers

Fiber lasers

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