2 March 2010 Terahertz plasmonic imaging
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Proceedings Volume 7600, Ultrafast Phenomena in Semiconductors and Nanostructure Materials XIV; 76001Y (2010); doi: 10.1117/12.845639
Event: SPIE OPTO, 2010, San Francisco, California, United States
Abstract
The application of THz plasmonics in imaging dielectric objects embedded in the metallic media is presented. Signatures of the embedded object was detected when the time domain information of the transmitted pulse was analyzed by THz time domain spectroscopy. The resolution of the acquired images was enhanced by using a super-resolution image processing technique. It is further shown that the images acquired from the pulse arrival time and phase magnitude reveal more details of the embedded object compared to the pulse power information.
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P. Maraghechi, C. Straatsma, A. Y. Elezzabi, "Terahertz plasmonic imaging", Proc. SPIE 7600, Ultrafast Phenomena in Semiconductors and Nanostructure Materials XIV, 76001Y (2 March 2010); doi: 10.1117/12.845639; https://doi.org/10.1117/12.845639
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KEYWORDS
Terahertz radiation

Dielectrics

Image resolution

Particles

Image processing

Super resolution

Plasmons

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