Paper
16 March 2010 Achieving p-InxGa1-xN alloys with high In contents
B. N Pantha, A. Sedhain, J. Li, J. Y. Lin, H. X. Jiang
Author Affiliations +
Proceedings Volume 7602, Gallium Nitride Materials and Devices V; 76020Z (2010) https://doi.org/10.1117/12.842313
Event: SPIE OPTO, 2010, San Francisco, California, United States
Abstract
Mg-doped InxGa1-xN alloys were grown by metal organic chemical vapor deposition (MOCVD) on semi-insulating c-GaN/sapphire templates. Hall effect measurements showed that Mg-doped InxGa1-xN epilayers are p-type for x up to 0.35. Mg-acceptor levels (EA) as a function of x, (x up to 0.35), were experimentally evaluated from the temperature dependent hole concentration. The observed EA in Mg-doped In0.35Ga0.65N alloys was about 43 meV, which is roughly 4 times smaller than that of Mg doped GaN. A room temperature resistivity as low as 0.4 Ωcm (with a hole concentration ~5 1018 cm-3 and hole mobility ~3 cm2/Vs) was obtained in Mg-doped In0.22Ga0.78N. It was observed that the photoluminescence (PL) intensity associated with the Mg related emission line decreases exponentially with x. The Mg energy levels in InGaN alloys obtained from PL measurements are consistent with those obtained from Hall-effect measurements.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
B. N Pantha, A. Sedhain, J. Li, J. Y. Lin, and H. X. Jiang "Achieving p-InxGa1-xN alloys with high In contents", Proc. SPIE 7602, Gallium Nitride Materials and Devices V, 76020Z (16 March 2010); https://doi.org/10.1117/12.842313
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KEYWORDS
Magnesium

Indium gallium nitride

Gallium nitride

Metalorganic chemical vapor deposition

Doping

Gallium

Luminescence

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