Paper
15 February 2010 Review on optical and electrical properties of oxide semiconductors
Dong Lim Kim, Hyun Jae Kim
Author Affiliations +
Proceedings Volume 7603, Oxide-based Materials and Devices; 760313 (2010) https://doi.org/10.1117/12.846661
Event: SPIE OPTO, 2010, San Francisco, California, United States
Abstract
Oxide semiconductors became one of the potential elements for large area electronics such as a channel for thin film transistors. Optical and electrical properties were modified by alloying or doping of several oxide materials; In2O3, ZnO, Ga2O3, and SnO2. The excellent properties achieved at the ternary or quaternary alloys could be explained by the role of each materials as a carrier controller, a conduction path, and etc. The metal oxide semiconductors were generally deposited by vacuum process but recently, alternative ways, like a sol-gel or an ink-jet printing, are suggested. In this review, diverse approaches on oxide semiconductors are shown, and an in-depth discussion of the optical and electrical properties alternation in metal oxide alloy fabricated by various methods is given.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dong Lim Kim and Hyun Jae Kim "Review on optical and electrical properties of oxide semiconductors", Proc. SPIE 7603, Oxide-based Materials and Devices, 760313 (15 February 2010); https://doi.org/10.1117/12.846661
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Cited by 3 scholarly publications.
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KEYWORDS
Oxides

Metals

Gallium

Semiconductors

Thin films

Zinc oxide

Tin

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