16 February 2010 A white-light interferometry scheme to measure wide-wavelength dispersion of thermo-optic coefficients of optical switch materials
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Proceedings Volume 7605, Optoelectronic Integrated Circuits XII; 76050T (2010); doi: 10.1117/12.842035
Event: SPIE OPTO, 2010, San Francisco, California, United States
Abstract
This paper reports demonstration of a new simple white-light interferometry method for continuous dispersion curves of the thermo-optic (TO) coefficients of optical samples. Phase shifts of the interference spectra of the white-light interferometer output are measured by changing temperature of an optical sample located in the one of the interferometer arms. A continuous dispersion curve of the TO coefficient of the sample materials over the full wavelength coverage region of the white light beam is obtained from the phase shift information with the temperature change. This new method is tested with a fused silica glass material of well-known optical properties to prove its accuracy by comparing the measured results with its known TO coefficient values. This continuous dispersion information of the TO coefficients of new optical materials will be useful for fabrication of the WDM signal processing devices or functional devices in multi-wavelengths.
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Se Min Kim, Seung Hwan Kim, Seoung Hun Lee, Yong Ku Kwon, Kyong Hon Kim, El-Hang Lee, "A white-light interferometry scheme to measure wide-wavelength dispersion of thermo-optic coefficients of optical switch materials", Proc. SPIE 7605, Optoelectronic Integrated Circuits XII, 76050T (16 February 2010); doi: 10.1117/12.842035; https://doi.org/10.1117/12.842035
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KEYWORDS
Temperature metrology

Interferometers

Dispersion

Thermal optics

Silica

Phase shifts

Interferometry

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