Paper
16 February 2010 Self-alignment and instability of waveguides induced by forces of guided and radiated fields
Amit Mizrahi, Kazuhiro Ikeda, Fabio Bonomelli, Vitaliy Lomakin, Yeshaiahu Fainman
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Proceedings Volume 7606, Silicon Photonics V; 76060L (2010) https://doi.org/10.1117/12.842610
Event: SPIE OPTO, 2010, San Francisco, California, United States
Abstract
We discuss a new effect of optical forces, namely, the self-alignment or instability of two parts of a waveguide broken by an offset and a gap. Using a mode matching technique, we investigate the case where there is no gap and only an offset. It is shown that for a TE incident mode, self-alignment occurs for small values of the waveguide thickness, whereas for large values, the system is unstable. For a TM incident mode, however, the situation is reversed and the two parts tend to self-align for large values of the waveguide thickness. It is also shown that the forces are due to the presence of both radiation modes, generated by the discontinuity, and the guided mode. For a TM incident mode, polarization surface charges are formed, that may cause strong self-alignment forces in both the transverse and longitudinal directions.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Amit Mizrahi, Kazuhiro Ikeda, Fabio Bonomelli, Vitaliy Lomakin, and Yeshaiahu Fainman "Self-alignment and instability of waveguides induced by forces of guided and radiated fields", Proc. SPIE 7606, Silicon Photonics V, 76060L (16 February 2010); https://doi.org/10.1117/12.842610
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KEYWORDS
Waveguides

Polarization

Finite element methods

Geometrical optics

Near field optics

Dielectric polarization

Dielectrics

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