Influence Of Density Of States Distribution And Trapping Rates On The Transient Response In Amorphous Semiconductors

G. J. Adriaenssens; G. Seynhaeve; H. Michiel

doi:10.1117/12.940162

21 August 1987 Influence Of Density Of States Distribution And Trapping Rates On The Transient Response In Amorphous Semiconductors

G. J. Adriaenssens, G. Seynhaeve, H. Michiel

Author Affiliations +

Proceedings Volume 0763, Physics of Amorphous Semiconductor Devices; (1987) https://doi.org/10.1117/12.940162
Event: OE LASE'87 and EO Imaging Symposium, 1987, Los Angeles, CA, United States

Abstract

A discrete version of the multiple trapping transport model for amorphous semiconductors is presented and its application to transient photocurrents demonstrated. The relationship between the average energy of a thermalizing carrier distribution and the demarcation energy of the TROK formalism is discussed in connection with structured density of states distributions. A novel way to calculate the transit time in a time-of-flight simulation is introduced and subsequently used to examine drift mobilities for various a-Si:H inspired density of states models.

Citation Download Citation

G. J. Adriaenssens, G. Seynhaeve, and H. Michiel "Influence Of Density Of States Distribution And Trapping Rates On The Transient Response In Amorphous Semiconductors", Proc. SPIE 0763, Physics of Amorphous Semiconductor Devices, (21 August 1987); https://doi.org/10.1117/12.940162

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available