Paper
2 April 2010 Nanoprobe maskless lithography
Ivo W. Rangelow, Tzvetan Ivanov, Yanko Sarov, Andreas Schuh, Andreas Frank, Hans Hartmann, Jens-Peter Zöllner, Dierdre L. Olynick, V. Kalchenko
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Abstract
Scanning probe-based methods for surface modification and lithography are an emerging method of producing sub 20-nm features for nanoelectronic applications. In this study, we have demonstrated the nanoscale lithography based on patterning of 10 to 50-nm-thick calix[4]arene by electric-field-induced electrostatic scanning probe lithography. The features size control is obtained using electrostatic interactions and depends on the applied bias and speed of the AFM tip. The width of the obtained lines and dots varies from 10 to 60 nm depending on tip-sharpness, tip-substrate separation and tip-bias voltage.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ivo W. Rangelow, Tzvetan Ivanov, Yanko Sarov, Andreas Schuh, Andreas Frank, Hans Hartmann, Jens-Peter Zöllner, Dierdre L. Olynick, and V. Kalchenko "Nanoprobe maskless lithography", Proc. SPIE 7637, Alternative Lithographic Technologies II, 76370V (2 April 2010); https://doi.org/10.1117/12.852265
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Cited by 26 scholarly publications and 2 patents.
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KEYWORDS
Scanning probe lithography

Lithography

Polymers

Molecules

Optical lithography

Polymer thin films

Electron beam lithography

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