A versatile optical characterization system is fabricated to measure various optical properties of
materials and devices. The optical system is based on Michelson interferometer with advanced software
algorithm to measure the intensity, phase angle, polarization state, and coherence of transmitted or
reflected light from the materials and devices under test. Innovative contour map of phase/intensity vs.
time/physical-quantity relation shows the dynamic evolution of interference patterns of multiple points
in the analysis area. Advanced software semi-automatically calculates change of photon intensity, phase
angle, polarization, and coherence which are results of various applied physical quantities such as
voltage, electric field, current, temperature, pressure, chemical density, and reaction time. The
measured optical property changes are converted by software to the changes of intrinsic and extrinsic
properties of materials and devices under test. The system is designed for multi-point measurements
which are suitable for 2D-array-pixel type devices. Therefore, this versatile optical measurement system
can accelerate the development of advanced adaptive optics elements and phase control elements.