9 September 2010 Use of the Abbe sine condition to quantify alignment aberrations in optical imaging systems
Author Affiliations +
Proceedings Volume 7652, International Optical Design Conference 2010; 765219 (2010) https://doi.org/10.1117/12.871959
Event: International Optical Design Conference 2010, 2010, Jackson Hole, WY, United States
Abstract
Violation of Abbe's sine condition is well-known to cause coma in axisymmetric imaging systems, and generally any offense against the sine condition (OSC) will cause aberrations that have linear dependence on the field angle. A well-corrected imaging system must obey the Abbe sine condition. A misaligned optical system can have particular forms of the OSC which are evaluated here. The lowest order non-trivial effects of misalignment have quadratic pupil dependence which causes a combination of astigmatism and focus that have linear field dependence. Higher order terms can arise from complex systems, but the effects of misalignment are nearly always dominated by the lowest order effects which can be fully characterized by measuring images on axis and the on-axis offense against the sine condition. By understanding the form of the on-axis images and the OSC, the state of alignment can be determined.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James H. Burge, James H. Burge, Chunyu Zhao, Chunyu Zhao, Sheng Huei Lu, Sheng Huei Lu, } "Use of the Abbe sine condition to quantify alignment aberrations in optical imaging systems", Proc. SPIE 7652, International Optical Design Conference 2010, 765219 (9 September 2010); doi: 10.1117/12.871959; https://doi.org/10.1117/12.871959
PROCEEDINGS
9 PAGES


SHARE
RELATED CONTENT

Planar diffractive imaging element design
Proceedings of SPIE (November 11 1999)
Differential equation of totally reflected wavefront
Proceedings of SPIE (December 06 2006)
Image plane tilt in optical systems
Proceedings of SPIE (December 01 1991)

Back to Top