9 September 2010 Challenges in polarization ray tracing
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Proceedings Volume 7652, International Optical Design Conference 2010; 76521U (2010) https://doi.org/10.1117/12.868939
Event: International Optical Design Conference 2010, 2010, Jackson Hole, WY, United States
Abstract
New polarization methods allow the ray tracing simulation of polarization critical components, including multilayer biaxial films, anisotropic and gyrotropic crystals, electro-optical, and magneto-optical materials bring many new challenges.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Russell A. Chipman, "Challenges in polarization ray tracing", Proc. SPIE 7652, International Optical Design Conference 2010, 76521U (9 September 2010); doi: 10.1117/12.868939; https://doi.org/10.1117/12.868939
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