Paper
11 October 2010 Modal analysis of low-level-light aiming sight-glass based on shock testing conditions
Youtang Gao, Huan Ding, Xiao Xue, Yuan Xu, Benkang Chang
Author Affiliations +
Abstract
Low-level-light ( LLL ) aiming sight-glass measurement technologies based on multiple circumstances testing conditions are always concerned by military equipments manufacturers. The article puts forward the concrete steps and method of shock circumstances testing measurement according to military optical equipments circumstances testing standard. Using shock theory and mathematical modeling analysis, shock model of LLL aiming sight-glass based on shock testing conditions is constructed and analyzed. Without considering resistances and under instantaneous half-sine shock pulse, the ratio of system response amplitude and half-sine pulse peak value is related to system inherent characteristic (inherent frequency, cycle T, etc.) and shock pulse duration D. The results indicate that given D/T⪆ 10.5, / 1 max / A = , half-sine shock pulse is transmitted by 1:1. Testing device response acceleration is equal to shock pulse peak acceleration. Testing device response is more intense under this condition. LLL aiming sight-glass structural performance and reticle zero point moving are influenced. Optical lens offset of LLL aiming sight-glass testing parts is impacted. Optical path parameters change and light transmission is influenced. What is more serious is that objective lens will be broken due to shock pulse transmission.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Youtang Gao, Huan Ding, Xiao Xue, Yuan Xu, and Benkang Chang "Modal analysis of low-level-light aiming sight-glass based on shock testing conditions", Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76562S (11 October 2010); https://doi.org/10.1117/12.863915
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KEYWORDS
Image processing

Modal analysis

Optics manufacturing

Teeth

Mathematical modeling

Optical testing

Electronics engineering

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