12 October 2010 Error analysis and application of dual beam focusing method
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Proceedings Volume 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 76563Y (2010); doi: 10.1117/12.866728
Event: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2010, Dalian, China
Abstract
Proposed a high-precision focusing method according to practical application-- Dual Beam Focusing method. And in accordance with geometrical optics theory introduced the basic principle of the focusing method, analyzed the error of this method, given an conclusion of the maximum error and the error during focusing when this method applied to telescope and microscope separately. Supported examples of applied this method to telescope system, microscope system and camera system. This method is simple and practical with high precision.
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Youhan Guo, Hui Zhao, "Error analysis and application of dual beam focusing method", Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76563Y (12 October 2010); doi: 10.1117/12.866728; http://dx.doi.org/10.1117/12.866728
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KEYWORDS
Microscopes

Telescopes

Error analysis

Imaging systems

Cameras

Neodymium

Optical testing

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