Digital speckle correlation method based on wavelet transform using micro-displacement measurement

Yuping Tai; Xinzhong Li

doi:10.1117/12.866301

16 October 2010 Digital speckle correlation method based on wavelet transform using micro-displacement measurement

Yuping Tai, Xinzhong Li

Proceedings Volume 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 76565P (2010) https://doi.org/10.1117/12.866301
Event: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2010, Dalian, China

Abstract

As an un-damage measurement technique, the digital speckle correlation method (DSCM) has been used in many measurement applications by advantage of its fast, sample and low requirement of the environment. However, its calculation efficiency and the accuracy were poor. Here, a novel digital speckle correlation method based on wavelet transform was proposed. Firstly, the dynamic speckle patterns generated by the sample were recorded, and then, the multi-scale analyse of wavelet transform were using in DSCM. Furthermore, employing the optimum noise reduction strategy, the dynamic speckle patterns were decomposed using symlets wavelet family, after that, the correlation registers were conducted. In this study, the efficiency and accuracy of this method were thoroughly investigated by theories and experiments. Compared to the traditional DSCM, the accuracy of this new method is improved dramatically and the relative error is less than 1%. Furthermore, the calculated consuming time is decreased to half of the traditional DSCM.

Citation Download Citation

Yuping Tai and Xinzhong Li "Digital speckle correlation method based on wavelet transform using micro-displacement measurement", Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76565P (16 October 2010); https://doi.org/10.1117/12.866301

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