Translator Disclaimer
Paper
22 October 2010 The impact of manufacturing errors of domain structure on frequency doubling efficiency in PPLN waveguides
Author Affiliations +
Abstract
While the length of polarization period in the periodically poled (PP) waveguides has manufacturing errors (MEs), the impact of this errors on Quasi-Phase-Macthed (QPM) frequency doubling efficiency (FDE), and that of polarization period Λ0 and length of the waveguides at the direction of transmission beams on ME tolerance, which are all theoretically analyzed. The results show that with the ME increasing, FDE decreases rapidly. And the ME tolerance of PP waveguides is inversely proportional to the length of waveguides and is directly proportional to the polarization period Λ0. These results provide a theoretical basis for choosing material of periodically poled crystal (PPC) and controlling MEs.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhengying Liu, Aihong Ren, Rongzhu Zhang, Jinglun Liu, Nianchun Sun, and Jianguo Chen "The impact of manufacturing errors of domain structure on frequency doubling efficiency in PPLN waveguides", Proc. SPIE 7657, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems, 76570W (22 October 2010); https://doi.org/10.1117/12.865718
PROCEEDINGS
5 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT


Back to Top