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22 October 2010 Assess image blur in photoelectric imaging system
Xiaofu Xie, Jin Zhou, Qinzhang Wu
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Proceedings Volume 7658, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology; 765803 (2010) https://doi.org/10.1117/12.866938
Event: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2010, Dalian, China
Abstract
The difficulty for no-reference image quality assessment is the lack of the information of the reference image. With the analysis of the mathematical model of the photoelectric imaging system and the reason for image blur, a method is proposed for constructing reference images, and at the same time the Structural Similarity index is introduced into noreference image quality assessment. A novel no-reference image quality assessment index called No-Reference Structural Sharpness is then proposed for quality evaluation of blurred images. This method constructs a reference image by a low-pass filter, and assesses the image quality by computing the structural similarity index between the original image and the reference one, thus considering the mathematical model of imaging system as well as the advantages of Structural Similarity index. The experimental results show that the new index is well in accordance with quality assessment results of both subjective evaluation and full-reference methods.
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Xiaofu Xie, Jin Zhou, and Qinzhang Wu "Assess image blur in photoelectric imaging system", Proc. SPIE 7658, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology, 765803 (22 October 2010); https://doi.org/10.1117/12.866938
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KEYWORDS
Image quality
Imaging systems
Linear filtering
Mathematical modeling
Image analysis
Performance modeling
Point spread functions
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