12 October 2010 Research on the the device of non-angular vibration for opto-electronic platform
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Abstract
The opto-electronic platform is the main equipment for aviation reconnaissance. It is a surveillance system with the function of search, recognition orientation and tracking by opto- electronic instruments. It is made up of opto- electronic instruments which are used to get high quality image , and stabilization tracking system to control stabilization and gesture of platform for exact tracking. The opto-electronic platform purpose is to achieve high quality image. Besides the impact of optic system, the image quality of the system is influenced greatly in the vibration environment .The research worked by Zhao peng which demonstrated the affection caused by angular vibration was worse than which caused by line vibration, and what was multiplied direct ratio with plane altitude. So it is necessary to design a new device which could be used widely and has good angular vibration isolation effect. According to the theory of parallelogram, the non-angular vibration device had been designed with spatial links, and the theory of non-angular vibration was analyzed. The three-dimensional model was set with UG, the analysis was done by ADAMS/vibration software. The acceleration and displacement response of the device in each direction was calculated by inspiriting it with sine wave of the acceleration in three directions, and the stiffness and damp were studied. All the work prove the design principle of the device is reasonable, and the device is adopted to keep the platform motion moving horizontally, at the meantime the device is good at isolating vibration in all directions.
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Yuan An, Yuan An, Chun-peng Song, Chun-peng Song, Rong-jun Kuang, Rong-jun Kuang, Guang Jin, Guang Jin, } "Research on the the device of non-angular vibration for opto-electronic platform", Proc. SPIE 7659, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Smart Structures and Materials in Manufacturing and Testing, 76590H (12 October 2010); doi: 10.1117/12.866834; https://doi.org/10.1117/12.866834
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