Paper
3 May 2010 Design and characterization of strain-compensated InGaAs/GaAsSb type-II MQW structure with operation wavelength at ~3μm
W. Y. Jiang, Baile Chen, Jinrong Yuan, A. L. Holmes Jr.
Author Affiliations +
Abstract
GaInAs/GaAsSb type-II multiple quantum wells (MQWs) grown on InP substrates by molecular beam epitaxy (MBE) were investigated for potential use in p-i-n photodiodes operating in the mid-infrared spectral region. In these quantum well structures, electrons and holes are spatially separated. The resulting spatially indirect type-II detection occurs at longer wavelength than the spatially direct intraband recombination in either GaInAs or GaAsSb. A 4-band k · p Hamiltonian model was employed to calculate the detection wavelengths and wavefunction overlaps. A p-i-n structure with 100 pairs of Ga0.66In034As (~7.0 nm)/GaAs0.25Sb0.75 (~5.0 nm) MQWs structure with operation wavelength of above 3.0 μm was designed and grown by MBE. The compressively strained GaAsSb layers are strain-compensated by tensile strained GaInAs. Photo response of above 3 μm was observed by room temperature responsivity measurements.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
W. Y. Jiang, Baile Chen, Jinrong Yuan, and A. L. Holmes Jr. "Design and characterization of strain-compensated InGaAs/GaAsSb type-II MQW structure with operation wavelength at ~3μm", Proc. SPIE 7660, Infrared Technology and Applications XXXVI, 76603O (3 May 2010); https://doi.org/10.1117/12.849562
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KEYWORDS
Antimony

Quantum wells

Mid-IR

Absorption

Electrons

Temperature metrology

PIN photodiodes

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