Two-band DMD-based infrared scene simulator

Julia Rentz Dupuis; David J. Mansur; Robert Vaillancourt; Thomas Evans; David Carlson; Elizabeth Schundler

doi:10.1117/12.848772

23 April 2010 Two-band DMD-based infrared scene simulator

Julia Rentz Dupuis, David J. Mansur, Robert Vaillancourt, Thomas Evans, David Carlson, Elizabeth Schundler

Proceedings Volume 7663, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV; 766302 (2010) https://doi.org/10.1117/12.848772
Event: SPIE Defense, Security, and Sensing, 2010, Orlando, Florida, United States

Abstract

OPTRA is developing a two-band midwave infrared (MWIR) scene projector based on digital micromirror device (DMD) technology; this projector is intended for training various IR tracking systems that exploit the relative intensities of two separate MWIR spectral bands. Our approach employs two DMDs, one for each spectral band, and an efficient optical design which overlays the scenes reflected by each through a common telecentric projector lens. Other key components are miniature thermal sources and a series of spectral filters. Through the use of pulse width modulation, we are able to control the relative intensities of objects simulated by the two channels thereby enabling realistic scene simulations of various targets and projectiles approaching the tracking system. Performance projections support radiant intensity levels, resolution, bandwidth, and scene durations that meet the requirements for a host of IR tracking test scenarios. In this paper we summarize the design and build and detail the system characterization of a prototype two-band projector. System characterization results include maximum radiant intensity, radiant intensity resolution, and angular resolution. We also present a series of projected images.

Citation Download Citation

Julia Rentz Dupuis, David J. Mansur, Robert Vaillancourt, Thomas Evans, David Carlson, and Elizabeth Schundler "Two-band DMD-based infrared scene simulator", Proc. SPIE 7663, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV, 766302 (23 April 2010); https://doi.org/10.1117/12.848772

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