5 May 2010 Radiation-induced failures and degradation of wireless real-time dosimeter under high-dose-rate irradiation
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Radiation-induced malfunction and degradation of electronic modules in certain operating conditions are described in this report. The cumulative radiation effects on Atmel AVR microcontrollers, and 2.4 GHz and 303 MHz wireless network devices were evaluated under gamma ray irradiation with dose rates of 100, 10 and 3 Gy/h. The radiation-induced malfunctions occurred at doses of 510±22 Gy for AVR microcontrollers, and 484±111 and 429±14 Gy for 2.4 GHz and 303 MHz wireless network devices, respectively, under a 100 Gy/h equivalent dose rate. The degradation of microcontrollers occurred for total ionizing doses between 400 and 600 Gy under X-ray irradiation. In addition, we evaluated the reliability of neutron dosimeters using a standard neutron field. One of the neutron dosimeters gave a reading that was half of the standard field value.
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K. Tsuchiya, K. Tsuchiya, K. Kuroki, K. Kuroki, N. Akiba, N. Akiba, K. Kurosawa, K. Kurosawa, T. Matsumoto, T. Matsumoto, J. Nishiyama, J. Nishiyama, H. Harano, H. Harano, } "Radiation-induced failures and degradation of wireless real-time dosimeter under high-dose-rate irradiation", Proc. SPIE 7665, Chemical, Biological, Radiological, Nuclear, and Explosives (CBRNE) Sensing XI, 76651G (5 May 2010); doi: 10.1117/12.849639; https://doi.org/10.1117/12.849639


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