PROCEEDINGS VOLUME 7671
SPIE DEFENSE, SECURITY, AND SENSING | 5-9 APRIL 2010
Terahertz Physics, Devices, and Systems IV: Advanced Applications in Industry and Defense
IN THIS VOLUME

7 Sessions, 29 Papers, 0 Presentations
Front Matter  (1)
THz Imaging  (6)
Proceedings Volume 7671 is from: Logo
SPIE DEFENSE, SECURITY, AND SENSING
5-9 April 2010
Orlando, Florida, United States
Front Matter
Proc. SPIE 7671, Front Matter: Volume 7671, 767101 (19 May 2010); doi: 10.1117/12.865882
Advanced Concepts in THz
Proc. SPIE 7671, Plasmon-resonant microchip emitters and detectors for terahertz sensing and spectroscopic applications, 767102 (27 April 2010); doi: 10.1117/12.850009
Proc. SPIE 7671, Ageing and embedding issues for high-Tc superconducting hot-electron bolometers for THz imaging, 767103 (24 April 2010); doi: 10.1117/12.850228
Proc. SPIE 7671, Terahertz detection with field-effect-transistors via bulk plasmon-assisted self-mixing, 767104 (27 April 2010); doi: 10.1117/12.849710
Proc. SPIE 7671, Radiometer-on-a-chip: a path toward super-compact submillimeter-wave imaging arrays, 767105 (27 April 2010); doi: 10.1117/12.850229
Proc. SPIE 7671, Optimization of semi-insulating surface-plasmon waveguides within terahertz QCL's using computational models, 767109 (27 April 2010); doi: 10.1117/12.855819
THz Spectroscopy
Proc. SPIE 7671, Terahertz absorption spectra of highly energetic chemicals, 76710A (27 April 2010); doi: 10.1117/12.848934
Proc. SPIE 7671, Low THz spectroscopy of some widely used explosives, 76710C (27 April 2010); doi: 10.1117/12.849921
Proc. SPIE 7671, Continuous wave terahertz emitter arrays for spectroscopy and imaging applications, 76710D (27 April 2010); doi: 10.1117/12.850090
Proc. SPIE 7671, Effect of periodic roughness and surface defects on the terahertz scattering behavior of cylindrical objects, 76710E (27 April 2010); doi: 10.1117/12.852909
Proc. SPIE 7671, Infrared/terahertz double resonance for chemical remote sensing: signatures and performance predictions, 76710F (27 April 2010); doi: 10.1117/12.853309
Proc. SPIE 7671, Method of THz spectrum dynamics analysis for identification of compound medium, 76710G (27 April 2010); doi: 10.1117/12.849983
THz Applications
Proc. SPIE 7671, Guided wave terahertz characterization of fingerprint lines in threat materials, 76710H (27 April 2010); doi: 10.1117/12.851807
Proc. SPIE 7671, Ballistic electronics: breaking the barrier in terahertz speed processing, 76710I (27 April 2010); doi: 10.1117/12.855999
Proc. SPIE 7671, Instrumentation for beam profiling in the terahertz regime, 76710J (27 April 2010); doi: 10.1117/12.849932
Proc. SPIE 7671, Portable video rate time domain terahertz line imager for security and aerospace nondestructive examination, 76710K (27 April 2010); doi: 10.1117/12.850143
Proc. SPIE 7671, Thermoelasticity analysis of skin tissue with the use of terahertz radiation, 76710M (27 April 2010); doi: 10.1117/12.849537
Proc. SPIE 7671, Terahertz-optical-asymmetric-demultiplexer (TOAD)-based arithmetic units for ultra-fast optical information processing, 76710N (27 April 2010); doi: 10.1117/12.849970
THz Generation
Proc. SPIE 7671, THz wave generation and imaging for industrial applications, 76710P (27 April 2010); doi: 10.1117/12.849069
Proc. SPIE 7671, Grating THz laser with optical pumping, 76710Q (27 April 2010); doi: 10.1117/12.849445
Proc. SPIE 7671, Design and fabrication of hollow flexible terahertz waveguides, 76710S (27 April 2010); doi: 10.1117/12.863374
Proc. SPIE 7671, High-efficiency transferred substrate GaAs varactor multipliers for the terahertz spectrum, 76710U (27 April 2010); doi: 10.1117/12.850205
THz Imaging
Proc. SPIE 7671, Passive millimeter-wave imaging for security and safety applications, 76710V (27 April 2010); doi: 10.1117/12.849491
Proc. SPIE 7671, Lab measurements to support modeling terahertz propagation in brownout conditions, 76710W (27 April 2010); doi: 10.1117/12.849728
Proc. SPIE 7671, Migrating from superconducting to semiconducting YBCO thin film bolometers as future far-infrared imaging pixels, 76710X (27 April 2010); doi: 10.1117/12.850161
Proc. SPIE 7671, Fast high-resolution terahertz radar imaging at 25 meters, 76710Y (27 April 2010); doi: 10.1117/12.850395
Proc. SPIE 7671, A microbolometer-based THz imager, 76710Z (27 April 2010); doi: 10.1117/12.850723
Proc. SPIE 7671, THz all-electronic 3D imaging for safety and security applications, 767111 (27 April 2010); doi: 10.1117/12.851434
Poster Session
Proc. SPIE 7671, A complex structure GaAs waveguide emitter with a periodic variation along the propagation direction for generation of terahertz radiation, 767113 (27 April 2010); doi: 10.1117/12.850069
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