WaferOptics(R) mass volume production and reliability

E. Wolterink; K. Demeyer

doi:10.1117/12.858325

13 May 2010 WaferOptics® mass volume production and reliability

E. Wolterink, K. Demeyer

Proceedings Volume 7716, Micro-Optics 2010; 771614 (2010) https://doi.org/10.1117/12.858325
Event: SPIE Photonics Europe, 2010, Brussels, Belgium

Abstract

The Anteryon WaferOptics® Technology platform contains imaging optics designs, materials, metrologies and combined with wafer level based Semicon & MEMS production methods. WaferOptics® first required complete new system engineering. This system closes the loop between application requirement specifications, Anteryon product specification, Monte Carlo Analysis, process windows, process controls and supply reject criteria. Regarding the Anteryon product Integrated Lens Stack (ILS), new design rules, test methods and control systems were assessed, implemented, validated and customer released for mass production. This includes novel reflowable materials, mastering process, replication, bonding, dicing, assembly, metrology, reliability programs and quality assurance systems. Many of Design of Experiments were performed to assess correlations between optical performance parameters and machine settings of all process steps. Lens metrologies such as FFL, BFL, and MTF were adapted for wafer level production and wafer mapping was introduced for yield management. Test methods for screening and validating suitable optical materials were designed. Critical failure modes such as delamination and popcorning were assessed and modeled with FEM. Anteryon successfully managed to integrate the different technologies starting from single prototypes to high yield mass volume production These parallel efforts resulted in a steep yield increase from 30% to over 90% in a 8 months period.

Citation Download Citation

E. Wolterink and K. Demeyer "WaferOptics® mass volume production and reliability", Proc. SPIE 7716, Micro-Optics 2010, 771614 (13 May 2010); https://doi.org/10.1117/12.858325

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