Ray tracing analysis of light scattering properties of randomly nano-textured ZnO films

M. Schulte; K. Bittkau; B. E. Pieters; S. Jorke; H. Stiebig; J. Hüpkes; U. Rau

doi:10.1117/12.854560

14 May 2010 Ray tracing analysis of light scattering properties of randomly nano-textured ZnO films

M. Schulte, K. Bittkau, B. E. Pieters, S. Jorke, H. Stiebig, J. Hüpkes, U. Rau

Author Affiliations +

Proceedings Volume 7717, Optical Modelling and Design; 77170N (2010) https://doi.org/10.1117/12.854560
Event: SPIE Photonics Europe, 2010, Brussels, Belgium

Abstract

We investigate the scattering behavior of nano-textured ZnO-Air and ZnO-Silicon interfaces for the application in thin film silicon solar cells. Contrary to the common approach, the numerical solution of the Maxwell's equations, we introduce a ray tracing approach based on geometric optics and the measured interface topography. The validity of this model is discussed by means of SNOM measurements and numerical solutions of the Maxwell's equations. We show, that the ray tracing model can qualitatively describe the formation of micro lenses, which are the dominant feature of the local scattering properties of the investigated interfaces. A quantitative analysis for the ZnO-Silicon interface at λ=488 nm shows that the ray tracing model corresponds well to the numerical solution of the Maxwell's equations. At λ=780 nm, a good agreement up to distance of approximately 1.5 μm from the topography minimum is achieved. The reduced effective wavelength in silicon leads to a better description of the ZnO-Silicon interface with respect to the ZnO-Air interface by the ray tracing model.

Citation Download Citation

M. Schulte, M. Schulte, K. Bittkau, K. Bittkau, B. E. Pieters, B. E. Pieters, S. Jorke, S. Jorke, H. Stiebig, H. Stiebig, J. Hüpkes, J. Hüpkes, U. Rau, U. Rau, } "Ray tracing analysis of light scattering properties of randomly nano-textured ZnO films", Proc. SPIE 7717, Optical Modelling and Design, 77170N (14 May 2010); doi: 10.1117/12.854560; https://doi.org/10.1117/12.854560

ACCESS THE FULL ARTICLE

PERSONAL SIGN IN
Full access may be available with your subscription

Email or Username Forgot your username?

Password Forgot your password?

Show

Remember Email/Username on this computer

Remember Password

No SPIE account? Create an account
or Institutional Sign In via Shibboleth

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $14.40

Non-members: $18.00 ADD TO CART

Show All Keywords

Keywords/Phrases

Search In:

Publication Years