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14 May 2010A generalized approach to modeling radiation pattern measurement methods for high-power LEDs
The rapid growth of high-power light-emitting diode (LED) technologies has gained momentum in developing accurate
tools and methods to measure performances of such products. For instance, it is widely recognized that confirming the
photobiological safety is extremely important since the light of the high-power products may be shone directly into
people's eyes. For many years, the international standard organizations, such as CIE, and researchers have been
developing guidelines and/or improving methods for measuring the LED radiation patterns, respectively. However, the
difficulties in LED measurements have been still highlighted by discrepancies in the experimental results among
different laboratories. In this paper, we first propose a mathematical formulation for the existing approaches, such as
those using two- and three-dimensional goniometers. Then, generalization of the measurement methods is presented to
improve the system measurement accuracy, through making a connection between a predicted accuracy and the
parameters of the optical setups (such as aperture size and working distance). To verify the effectiveness of our approach,
the experiments are conducted to evaluate and compare the performances of the proposed approach. The measurement
results indicate that our approach is consistent from theory to practice.
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Gao-Wei Chang, Chia-Cheng Liao, Yung-Chang Chen, "A generalized approach to modeling radiation pattern measurement methods for high-power LEDs," Proc. SPIE 7717, Optical Modelling and Design, 77171F (14 May 2010); https://doi.org/10.1117/12.854194