14 May 2010 Multiresolution analysis of 2D confocal microscope images
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Proceedings Volume 7718, Optical Micro- and Nanometrology III; 77180I (2010); doi: 10.1117/12.854498
Event: SPIE Photonics Europe, 2010, Brussels, Belgium
Abstract
The functionality of the lifting is exploited scheme to analyze several white light confocal images of tribological/ engineering surfaces in terms of their roughness, waviness and form. The roughness parameters obtained are then compared with those resulting from other standard filtering techniques, like Gaussian filtering. Based on the wavelet transform, an attempt will also be made to provide a robust parameter for surface characterization.
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D. Bianchi, A. Vernes, G. Vorlaufer, G. Betz, "Multiresolution analysis of 2D confocal microscope images", Proc. SPIE 7718, Optical Micro- and Nanometrology III, 77180I (14 May 2010); doi: 10.1117/12.854498; https://doi.org/10.1117/12.854498
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KEYWORDS
Wavelets

Confocal microscopy

Gaussian filters

Microscopes

Wavelet transforms

Fast wavelet transforms

Analytical research

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