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3 June 2010 Traceable nanoscale length metrology using a metrological Scanning Probe Microscope
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Proceedings Volume 7729, Scanning Microscopy 2010; 77290L (2010)
Event: Scanning Microscopy 2010, 2010, Monterey, California, United States
We give an overview of the design and planned operation of the metrological Scanning Probe Microscope (mSPM) currently under development at the National Measurement Institute Australia (NMIA) and highlight the metrological principles guiding the design of the instrument. The mSPM facility is being established as part of the nanometrology program at NMIA and will provide the link in the traceability chain between dimensional measurements made at the nanometer scale and the realization of the SI meter at NMIA. The instrument will provide a measurement volume of 100 μm × 100 μm × 25 μm with a target uncertainty of 1 nm for the position measurement.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Malcolm Lawn, Jan Herrmann, Christopher H. Freund, John R. Miles, Malcolm Gray, Daniel Shaddock, Victoria A. Coleman, and Asa K. Jämting "Traceable nanoscale length metrology using a metrological Scanning Probe Microscope", Proc. SPIE 7729, Scanning Microscopy 2010, 77290L (3 June 2010);

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