Property study of TbFeCo for all-optical magnetic recording

M. L. Lee; C. H. Lim; K. L. Toh; C. L. Gan; J. M. Li; L. P. Shi

doi:10.1117/12.859230

17 June 2010 Property study of TbFeCo for all-optical magnetic recording

M. L. Lee, C. H. Lim, K. L. Toh, C. L. Gan, J. M. Li, L. P. Shi

Proceedings Volume 7730, Optical Data Storage 2010; 77300Q (2010) https://doi.org/10.1117/12.859230
Event: Optical Data Storage 2010, 2010, Boulder, Colorado, United States

Abstract

Thin films properties of amorphous TbFeCo were studied to determine its suitability for use in all optical magnetic recording. Ellipsometric techniques have been used to determine the optical properties of the films in the wavelength range of 350 to 800 nm. The effects of film thickness, Ar flow rate and presence of Ag under layer on magnetic properties were also investigated.

Citation Download Citation

M. L. Lee, C. H. Lim, K. L. Toh, C. L. Gan, J. M. Li, and L. P. Shi "Property study of TbFeCo for all-optical magnetic recording", Proc. SPIE 7730, Optical Data Storage 2010, 77300Q (17 June 2010); https://doi.org/10.1117/12.859230

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