Focal plane instrumentation for the Wide-Field X-ray Telescope

M. W. Bautz; R. F. Foster; S. S. Murray

doi:10.1117/12.857803

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29 July 2010 Focal plane instrumentation for the Wide-Field X-ray Telescope

M. W. Bautz, R. F. Foster, S. S. Murray

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Proceedings Volume 7732, Space Telescopes and Instrumentation 2010: Ultraviolet to Gamma Ray; 77324G (2010) https://doi.org/10.1117/12.857803
Event: SPIE Astronomical Telescopes + Instrumentation, 2010, San Diego, California, United States

Abstract

The three X-ray imaging focal planes of the Wide-Field X-ray Telescope (WFXT) Mission will each have a field of view up to 1 degree square, pixel pitch smaller than 1 arcsec, excellent X-ray detection efficiency and spectral resolving power near the theoretical limit for silicon over the 0.2 - 6 keV spectral band. We describe the baseline concept for the WFXT focal planes. The detectors are derived from MIT Lincoln Laboratory CCDs currently operating in orbit on Chandra and Suzaku. Here we describe the baseline WFXT focal plane instrumentation and briefly consider options for alternative detector technologies.

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M. W. Bautz, R. F. Foster, and S. S. Murray "Focal plane instrumentation for the Wide-Field X-ray Telescope", Proc. SPIE 7732, Space Telescopes and Instrumentation 2010: Ultraviolet to Gamma Ray, 77324G (29 July 2010); https://doi.org/10.1117/12.857803

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