20 July 2010 High-contrast observations with slicer-based integral field spectrographs 2: experimental tests
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As part of the Phase A study for the EPICS instrument, we investigate if there are any contrast limitations imposed by the choice of the integral field spectrograph (IFS) technology, and if so, to determine the contrast limits applicable to each technology. In this document we investigate (through production of a prototype and actual laboratory tests) the contrast limitations inherent in a slicer based IFS. Using an experimental set-up that generates speckles at the input to a slicer based integral field spectrograph, we have conclusively demonstrated that a slicer based IFS (that has not been specifically designed for high contrast observations) does NOT limit the contrast achieved by a planet finding instrument at the level of at least one part in 250 per spectral channel at R~800. This limit is imposed by the limited source intensity available for the measurements made with the test bed's current setup and is to be improved upon in the near future. This level of speckle noise rejection already satisfies the top level requirements of the EPICS instrument.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Graeme S. Salter, Graeme S. Salter, Niranjan A. Thatte, Niranjan A. Thatte, Mathias Tecza, Mathias Tecza, Fraser Clarke, Fraser Clarke, Christophe Verinaud, Christophe Verinaud, Markus E. Kasper, Markus E. Kasper, } "High-contrast observations with slicer-based integral field spectrographs 2: experimental tests", Proc. SPIE 7735, Ground-based and Airborne Instrumentation for Astronomy III, 77357L (20 July 2010); doi: 10.1117/12.857392; https://doi.org/10.1117/12.857392

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