19 July 2010 Metrology systems for active alignment control of the Hobby-Eberly Telescope wide field corrector
Author Affiliations +
Abstract
The Hobby-Eberly Telescope (HET) Wide-Field Upgrade (WFU) will be equipped with new metrology systems to actively control the optical alignment of the new four-mirror Wide-Field Corrector (WFC) as it tracks sidereal motion with respect to the fixed primary mirror. These systems include a tip/tilt sensor (TTS), distance measuring interferometers (DMI), guide probes (GP), and wavefront sensors (WFS). While the TTS and DMIs are to monitor the mechanical alignment of the WFC, the WFSs and GPs will produce direct measurement of the optical alignment of the WFC with respect to the HET primary mirror. Together, these systems provide fully redundant alignment and pointing information for the telescope, thereby keeping the WFC in focus and suppressing alignment-driven field aberrations. We describe the current snapshot of these systems and discuss their roles, expected performance, and operation plans.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hanshin Lee, Gary J. Hill, Michael Hart, Mark E. Cornell, Richard Savage, Brian Vattiat, Dave Perry, William M. Moller, Tom Rafferty, Trey Taylor, Marc D. Rafal, "Metrology systems for active alignment control of the Hobby-Eberly Telescope wide field corrector", Proc. SPIE 7739, Modern Technologies in Space- and Ground-based Telescopes and Instrumentation, 77390U (19 July 2010); doi: 10.1117/12.857163; https://doi.org/10.1117/12.857163
PROCEEDINGS
9 PAGES


SHARE
RELATED CONTENT

Metrology systems of Hobby-Eberly Telescope wide field upgrade
Proceedings of SPIE (September 27 2012)
Latest developments on the loop control system of AdOpt@TNG
Proceedings of SPIE (October 25 2004)
The 3,6 m optical telescope for ARIES the control...
Proceedings of SPIE (September 24 2012)
Results of the Guide 2 telescope testbed for the SIM...
Proceedings of SPIE (July 21 2010)
SIM Lite: ground alignment of the instrument
Proceedings of SPIE (August 02 2010)
Nulling at the Keck interferometer
Proceedings of SPIE (June 23 2006)
EUVL projection-camera alignment methods
Proceedings of SPIE (June 25 1999)

Back to Top