3 July 2010 Study of pixel area variations in fully depleted thick CCD
Author Affiliations +
Proceedings Volume 7742, High Energy, Optical, and Infrared Detectors for Astronomy IV; 774206 (2010); doi: 10.1117/12.856519
Event: SPIE Astronomical Telescopes + Instrumentation, 2010, San Diego, California, United States
Future wide field astronomical surveys, like Large Synoptic Survey Telescope (LSST), require photometric precision on the percent level. The accuracy of sensor calibration procedures should match these requirements. Pixel size variations found in CCDs from different manufacturers are the source of systematic errors in the flat field calibration procedure. To achieve the calibration accuracy required to meet the most demanding science goals this effect should be taken into account. The study of pixel area variations was performed for fully depleted, thick CCDs produced in a technology study for LSST. These are n-channel, 100μm thick devices. We find pixel size variations in both row and column directions. The size variation magnitude is smaller in the row direction. In addition, diffusion is found to smooth out electron density variations. It is shown that the characteristic diffusion width can be extracted from the flat field data. Results on pixel area variations and diffusion, data features, analysis technique and modeling technique are presented and discussed.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
I. V. Kotov, A. I. Kotov, J. Frank, P. Kubanek, M. Prouza, P. O'Connor, V. Radeka, P. Takacs, "Study of pixel area variations in fully depleted thick CCD", Proc. SPIE 7742, High Energy, Optical, and Infrared Detectors for Astronomy IV, 774206 (3 July 2010); doi: 10.1117/12.856519; https://doi.org/10.1117/12.856519


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