Paper
16 July 2010 A fast model of radiation-induced electron trapping in CCDs for implementation in the Gaia data processing
Author Affiliations +
Abstract
The European Space Agency's Gaia mission1 is scheduled for launch in 2012. It will operate at L2 for 5 years, rotating slowly so that its two optical telescopes will repeatedly observe more than one billion stars. The resulting data set will be iteratively reduced to solve for the relative position, parallax-distance and proper motion of every observed star, yielding a three dimensional dynamical model of our galaxy. The focal plane contains 106 large area silicon CCDs continuously operating in TDI mode at a line rate synchronised with the satellite rotation.2 One of the greatest challenges facing the mission is radiation damage in the CCDs which will cause charge loss and image distortion. This is particularly severe because the large focal plane is difficult to shield and because the launch will coincide with solar maximum. Despite steps taken to minimize the effects of radiation (e.g. regular use of charge injection), the residual distortion will need to be calibrated during the pipeline data processing. Due to the volume of data involved, this requires a trapping model which is physically realistic, yet fast enough and simple enough to implement in the pipeline. The current prototype Charge Distortion Model will be presented. This model was developed specifically for Gaia in TDI mode. However, an imaging mode version has already been applied to other missions, for example, to indicate the potential impact of radiation damage on the proposed Euclid mission.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alexander Short, Thibaut Prod'homme, Michael Weiler, Scott Brown, and Anthony Brown "A fast model of radiation-induced electron trapping in CCDs for implementation in the Gaia data processing", Proc. SPIE 7742, High Energy, Optical, and Infrared Detectors for Astronomy IV, 774212 (16 July 2010); https://doi.org/10.1117/12.856386
Lens.org Logo
CITATIONS
Cited by 7 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Data modeling

Charge-coupled devices

Radiation effects

Distortion

Neon

Data processing

Modeling

Back to Top