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19 May 2010 Numerical modeling of scanning near-field optical microscopy for fluorescence-less DNA detection
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Proceedings Volume 7743, Southeast Asian International Advances in Micro/Nanotechnology; 77430I (2010) https://doi.org/10.1117/12.863533
Event: Southeast Asian International Advances in Micro/Nano-technology, 2010, Bangkok, Thailand
Abstract
Scanning near-field optical microscopy (SNOM) has gained wide interest as a viable microscopic technique for the study of surface properties at the nanoscale. SNOM uses optical fiber to detect evanescent wave which provides a high resolution imaging beyond the diffraction limit. The collected intensity is influenced by complex refractive index of the sample. This project exploits the property of evanescent wave to discriminate between unhybridized and hybridized DNA which has a significant difference in complex refractive index. The concept could become a promising alternative since it circumvents fluorescence-labeling problems. The research focuses on numerical modeling by mean of finitedifference beam propagation and DNA hybridization based on empirical data from literatures.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chanachai Poosri, Atikrit Chanjavanakul, and Waleed S. Mohammed "Numerical modeling of scanning near-field optical microscopy for fluorescence-less DNA detection", Proc. SPIE 7743, Southeast Asian International Advances in Micro/Nanotechnology, 77430I (19 May 2010); https://doi.org/10.1117/12.863533
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