22 September 2010 Problem of Talbot self-images localization: adaptive photo-EMF-based detector vs. CCD-based methods
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Proceedings Volume 7750, Photonics North 2010; 77500Y (2010) https://doi.org/10.1117/12.873399
Event: Photonics North 2010, 2010, Niagara Falls, Canada
Talbot self-images localization is important in many optical applications such as interferometry, metrology and nanolithography. Usually, the problem of self-images localization is reduced to the finding the planes of maximal light pattern visibility. There are several conventional techniques that determine the contrast of an intensity distribution generated by a periodical object, such as root mean square (RMS) method, and variogram-based method. In all these cases, a CCD camera is used to record the light patterns that are processed and analyzed in order to find the self-image position. Recently, it has been proposed the use an adaptive photo-detector based on the non-steadystate photo-electromotive force (photo-EMF) effect, which uses periodically oscillating light pattern to induce alternating current through the short-circuited photoconductive sample. Here we perform the theoretical analysis of the technique based on the photo-EMF effect against the conventional methods for the localization of the Talbot patterns.
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Ileana Guízar-Iturbide, Ileana Guízar-Iturbide, Luis Gerardo de la Fraga, Luis Gerardo de la Fraga, Ponciano Rodríguez-Montero, Ponciano Rodríguez-Montero, Svetlana Mansurova, Svetlana Mansurova, } "Problem of Talbot self-images localization: adaptive photo-EMF-based detector vs. CCD-based methods", Proc. SPIE 7750, Photonics North 2010, 77500Y (22 September 2010); doi: 10.1117/12.873399; https://doi.org/10.1117/12.873399

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