Paper
22 September 2010 Linewidth enhancement factor of InAs/InP quantum dot lasers around 1.53 μm
Z. J. Jiao, Z. G. Lu, J. R. Liu, P. J. Poole, P. J. Barrios, D, Poitras, X. P. Zhang
Author Affiliations +
Proceedings Volume 7750, Photonics North 2010; 77501C (2010) https://doi.org/10.1117/12.872925
Event: Photonics North 2010, 2010, Niagara Falls, Canada
Abstract
Linewidth enhancement factor (LEF) of InAs/InP quantum dot (QD) multi-wavelength lasers (MWL) emitting at 1.53 μm are investigated both above and below threshold. Above threshold, LEFs at three different wavelengths around the gain peak by injection locking technique are obtained to be 1.63, 1.37 and 1.59, respectively. Then by Hakki-Paoli method LEF is found to decrease with increased current and shows a value of less than 1 below threshold. These small LEF values have confirmed our InAs/InP QDs are perfect gain materials for laser devices around 1.5 μm.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Z. J. Jiao, Z. G. Lu, J. R. Liu, P. J. Poole, P. J. Barrios, D, Poitras, and X. P. Zhang "Linewidth enhancement factor of InAs/InP quantum dot lasers around 1.53 μm", Proc. SPIE 7750, Photonics North 2010, 77501C (22 September 2010); https://doi.org/10.1117/12.872925
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KEYWORDS
Stereolithography

Refractive index

Laser damage threshold

Quantum dot lasers

Semiconductor lasers

Control systems

Laser applications

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